وحدة الماسح الضوئي JEOL AP002102-00

دليل المنتج：

وحدة الماسح الضوئي JEOL AP002102-00
1. JEOL AP002102-00 is responsible for the internal beam scanning and acquisition work of the electron microscope
2. The scanning runs smoothly, and the imaging acquisition image is uniform and stable
3. Resist internal electromagnetic interference of the device, and the scanning trajectory is not easily offset
4. Snap on fixation makes disassembly, صيانة, and replacement very convenient
5. Moderate working power consumption, and long-term scanning tasks are not prone to high temperatures
6. Mainly used for scanning and imaging detection of various material microstructures
7. The wiring terminals are securely locked, and there will be no disconnection when the body vibrates
8. Perfectly compatible with the instrument control system, without the need for major parameter changes

9. Scanning gear switching is sensitive, and different observation modes can be quickly switched
10. Adapt to semiconductor wafer surface defect scanning and inspection operations
11. Internal circuit partition layout, scanning control signals do not interfere with each other
12. The computer room can work continuously throughout the day within the normal temperature range
13. The surface has simple dust protection, and dust accumulation is not easy to affect scanning accuracy
14. Insulation protection is in place to avoid circuit leakage and short circuit problems
15. JEOL AP002102-00 factory precision calibration completed, installed and directly put into scanning
The JEOL AP002102-00 scanner module is a core scanning accessory for electron microscopes, with precise and stable imaging, and simple daily operation and maintenance.

صور مفصلة للمنتج：

AP002102-00

فيديو المنتج

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روابط أخرى

TK803V018 3BSC950130R1 cable
5SHX2645L0004 3BHL000389P0104 IGCT card
3BHB003154R0101 5SXE04-0150 GVC707AE01 بطاقة IGCT