JEOL PH01134-1 stretching device

دليل المنتج：

JEOL PH01134-1 stretching device
1. JEOL PH01134-1 can be used for in-situ testing with electron microscopes of the same brand
2. مدمجة الحجم, placed in the sample chamber will not cause space occupation
3. Stretching runs smoothly and is not easily shaken during the operation process
4. Accurate displacement control, precise control of small stretching amounts
5. The supporting fixture is firmly clamped, and the test sample is not easy to slip off
6. Capable of adapting to various types of samples such as thin sheets and films
7. The overall structure is rigid enough, and the deformation amplitude under its own force is small
8. Adapt to high vacuum environment of electron microscope, without damaging the vacuum degree inside the cavity

9. The stretching speed can be flexibly adjusted to meet different testing needs
10. سهل التفكيك والتجمع, time-saving and effortless sample replacement operation
11. Real time collection of tensile force related data
13. Low work heat, will not affect normal electron microscopy imaging
14. Equipped with travel limit function to prevent overload damage to the device
15. Standard docking interface, JEOL PH01134-1 directly connected to the host without modification
إجمالي, the JEOL PH01134-1 stretching device is stable and easy to use, making it suitable for in-situ tensile testing operations under electron microscopy.

صور مفصلة للمنتج：

PH01134-1

فيديو المنتج

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