JEOL AP002686-00 Vacuum Controller   

Product Manual：

JEOL AP002686-00 vacuum controller is compatible with JSM-6701F scanning electron microscope to control the entire vacuum pumping and valve timing.
1. Original components, matched with JEOL JSM-6701F field emission scanning electron microscope
2. Collect pressure signals from vacuum gauges and monitor the vacuum degree of the chamber in real time
3. Control the automatic start stop and switch timing of vacuum pumps and vacuum valves
4. Automatically execute vacuuming and deflation processes to meet the requirements of electron microscopy operating conditions
5. Threshold interlock protection, electron beam cannot be turned on due to insufficient vacuum
6. Slot installation, easy and fast disassembly and replacement

7. Signal isolation design to prevent interference with image signals
8. Anti static protection, protecting precision circuits inside the board
9. Electromagnetic shielding structure, suitable for laboratory electromagnetic environment
10. Industrial grade components that support long-term continuous operation of instruments
11. Automatic alarm for vacuum abnormality, identifying leaks and pump body faults
12. Integrated overvoltage and overload multiple circuit protection
13. The substrate is stable and can withstand fluctuations in temperature and humidity environments
14. Clear line zoning for easy troubleshooting and maintenance
15. High dimensional accuracy, direct replacement without complex calibration
The JEOL AP002686-00 vacuum controller is responsible for monitoring and automatic process control of the scanning electron microscope sample chamber and tube vacuum system.

Product detailed pictures：

AP002686-00

product video

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