JEOL RF-Z02005TMN150 matching controller 

Product Manual：

The JEOL RF-Z02005TMN150 matching controller is a Japanese electronic electron microscope matching RF automatic impedance matching unit, which is used in conjunction with an RF power supply to achieve dynamic adaptation of ion source RF loads.
1. Original factory components, compatible with JEOL series field emission scanning electron microscope ion system
2. Real time detection of RF standing waves, automatic adjustment of matching parameters
3. Fast impedance tracking, quickly completing tuning when load changes
4. Reduce RF reflection power and improve energy transmission efficiency
5. Built in standing wave high and over temperature multiple safety protections
6. Reduce RF reflection and protect the front-end RF generator

7. Modular integrated structure, compact installation inside the device
8. Support communication with the main control of the whole machine and synchronize the running status
9. Electromagnetic shielding design to suppress RF clutter interference in imaging
10. Continuous and stable output to ensure consistency of ion source operating conditions
11. Real time feedback on matching status for easy device monitoring
12. Optimization of heat dissipation scheme, controllable temperature rise during long-term operation
13. Standardized cable interface, easy disassembly and replacement operation
14. Accurate calibration of factory parameters, simple debugging after replacement
15. Industrial grade components, suitable for long-term laboratory operation
The JEOL RF-Z02005TMN150 matching controller is mainly used for scanning electron microscopy plasma cleaning and ion source RF circuit impedance matching.

Product detailed pictures：

RF-Z02005TMN150

product video

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