JEOL AP002492-00 acquisition card

Руководство по продукту：

JEOL AP002492-00 acquisition card
1. JEOL AP002492-00 collects various detection data during the operation of electron microscopy
2. The collection rate is stable, and there will be no omissions or losses in data collection
3. Анти-электромагнитные помехи, high accuracy of collected data
4. Установка слота, легкая и быстрая разборка и обслуживание
5. Низкое энергопотребление, less prone to overheating after long-term operation
6. Commonly used for collecting micro sample testing data in laboratories
7. The interface is firmly plugged in, and the device will not disconnect due to vibration
8. Adapt to the original factory control system, no need to modify parameters for docking
9. Separate multi-channel collection, with each group of data not interfering with each other

10. Data collection work for adapting semiconductor wafer surface inspection
11. Low internal circuit loss and high data transmission efficiency
12. Stable data collection throughout the day under standard temperature conditions in the computer room
13. Comes with simple dust protection, making dust accumulation less likely to cause contact failures
14. Надежная изоляция, avoiding safety hazards of leakage and short circuit
15. JEOL AP002492-00 has completed factory inspection and calibration, and can be put into use for data collection after installation
The JEOL AP002492-00 acquisition card is specialized in collecting precision instrument detection data, with stable acquisition and easy installation and maintenance.

Подробные фотографии продукта：

AP002492-00

видео о продукте

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