هاماماتسو C8779K-01 وحدة المسح
دليل المنتج：
هاماماتسو C8779K-01 وحدة المسح
مقدمة: هاماماتسو C8779K-01 Hamamatsu Optical Scanning Unit has high imaging accuracy and stable scanning, suitable for continuous inspection operations of semiconductor wafer appearance inspection equipment.
High precision optical scanning optical path, clear identification of subtle defects
Anti stray light design for optical path, interference free imaging in workshop environment
Built in overload and over temperature circuit protection, extending the service life
Standardized overall module, سهل التفكيك, صيانة, والاستبدال
Indicator lights distinguish between standby, scanning, and abnormal alarm states
Original factory equipped Hamamatsu detection optical system with high adaptability
High speed continuous scanning, smooth detection rhythm without lagging
Power on automatic optical path self-test, quickly locate optical path faults
إمدادات الطاقة القياسية الصناعية, suitable for dust-free constant temperature testing workshop
Compact integrated module, توفير مساحة تركيب المعدات
هيكل مقاوم للغبار مختوم, suitable for clean factory working conditions
Stable data transmission interface, compatible with the main control image processing system
Built in parameter storage, no need to readjust when switching detection samples
Automatically record scan exception logs for easy maintenance and troubleshooting
Precision optical components with minimal long-term performance degradation
خاتمة: This scanning unit has precise imaging, dust resistance, متانة, وسهولة الصيانة, making it a core replacement spare part for semiconductor optical defect detection equipment.
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