HAMAMATSU C8779K-01 scanning unit

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HAMAMATSU C8779K-01 scanning unit
Введение: HAMAMATSU C8779K-01 Hamamatsu Optical Scanning Unit has high imaging accuracy and stable scanning, suitable for continuous inspection operations of semiconductor wafer appearance inspection equipment.
High precision optical scanning optical path, clear identification of subtle defects
Anti stray light design for optical path, interference free imaging in workshop environment
Built in overload and over temperature circuit protection, extending the service life
Standardized overall module, easy disassembly, обслуживание, и замена
Indicator lights distinguish between standby, scanning, and abnormal alarm states
Original factory equipped Hamamatsu detection optical system with high adaptability

High speed continuous scanning, smooth detection rhythm without lagging
Power on automatic optical path self-test, quickly locate optical path faults
Industrial standard power supply, suitable for dust-free constant temperature testing workshop
Compact integrated module, saving equipment installation space
Sealed dust-proof structure, suitable for clean factory working conditions
Stable data transmission interface, compatible with the main control image processing system
Built in parameter storage, no need to readjust when switching detection samples
Automatically record scan exception logs for easy maintenance and troubleshooting
Precision optical components with minimal long-term performance degradation
Заключение: This scanning unit has precise imaging, пыленепроницаемость, durability, and easy maintenance, making it a core replacement spare part for semiconductor optical defect detection equipment.

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